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Autori principali: Yoo, Youngju, Kim, Seho, Kim, Changick
Natura: Preprint
Pubblicazione: 2025
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Accesso online:https://arxiv.org/abs/2510.12182
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author Yoo, Youngju
Kim, Seho
Kim, Changick
author_facet Yoo, Youngju
Kim, Seho
Kim, Changick
contents 3D instance segmentation is crucial for understanding complex 3D environments, yet fully supervised methods require dense point-level annotations, resulting in substantial annotation costs and labor overhead. To mitigate this, box-level annotations have been explored as a weaker but more scalable form of supervision. However, box annotations inherently introduce ambiguity in overlapping regions, making accurate point-to-instance assignment challenging. Recent methods address this ambiguity by generating pseudo-masks through training a dedicated pseudo-labeler in an additional training stage. However, such two-stage pipelines often increase overall training time and complexity, hinder end-to-end optimization. To overcome these challenges, we propose BEEP3D-Box-supervised End-to-End Pseudo-mask generation for 3D instance segmentation. BEEP3D adopts a student-teacher framework, where the teacher model serves as a pseudo-labeler and is updated by the student model via an Exponential Moving Average. To better guide the teacher model to generate precise pseudo-masks, we introduce an instance center-based query refinement that enhances position query localization and leverages features near instance centers. Additionally, we design two novel losses-query consistency loss and masked feature consistency loss-to align semantic and geometric signals between predictions and pseudo-masks. Extensive experiments on ScanNetV2 and S3DIS datasets demonstrate that BEEP3D achieves competitive or superior performance compared to state-of-the-art weakly supervised methods while remaining computationally efficient.
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spellingShingle BEEP3D: Box-Supervised End-to-End Pseudo-Mask Generation for 3D Instance Segmentation
Yoo, Youngju
Kim, Seho
Kim, Changick
Computer Vision and Pattern Recognition
3D instance segmentation is crucial for understanding complex 3D environments, yet fully supervised methods require dense point-level annotations, resulting in substantial annotation costs and labor overhead. To mitigate this, box-level annotations have been explored as a weaker but more scalable form of supervision. However, box annotations inherently introduce ambiguity in overlapping regions, making accurate point-to-instance assignment challenging. Recent methods address this ambiguity by generating pseudo-masks through training a dedicated pseudo-labeler in an additional training stage. However, such two-stage pipelines often increase overall training time and complexity, hinder end-to-end optimization. To overcome these challenges, we propose BEEP3D-Box-supervised End-to-End Pseudo-mask generation for 3D instance segmentation. BEEP3D adopts a student-teacher framework, where the teacher model serves as a pseudo-labeler and is updated by the student model via an Exponential Moving Average. To better guide the teacher model to generate precise pseudo-masks, we introduce an instance center-based query refinement that enhances position query localization and leverages features near instance centers. Additionally, we design two novel losses-query consistency loss and masked feature consistency loss-to align semantic and geometric signals between predictions and pseudo-masks. Extensive experiments on ScanNetV2 and S3DIS datasets demonstrate that BEEP3D achieves competitive or superior performance compared to state-of-the-art weakly supervised methods while remaining computationally efficient.
title BEEP3D: Box-Supervised End-to-End Pseudo-Mask Generation for 3D Instance Segmentation
topic Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2510.12182