Measurement-induced entanglement in noisy 2D random Clifford circuits

Fuente: arXiv
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Bibliographic Details
Main Authors: Wei, Zhi-Yuan, Nelson, Jon, Rajakumar, Joel, Cruz, Esther, Gorshkov, Alexey V., Gullans, Michael J., Malz, Daniel
Format: Preprint
Published: 2025
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