Breaking On/Off-coupling Loss Degeneracies via Bidirectional Nonlinear Optics

Fuente: arXiv
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Autori principali: Wu, Bo-Han, Mehrabad, Mahmoud Jalali, Yu, Mengjie, Englund, Dirk
Natura: Preprint
Pubblicazione: 2025
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author Wu, Bo-Han
Mehrabad, Mahmoud Jalali
Yu, Mengjie
Englund, Dirk
author_facet Wu, Bo-Han
Mehrabad, Mahmoud Jalali
Yu, Mengjie
Englund, Dirk
contents Accurate evaluation of nonlinear photonic integrated circuits requires separating input and output coupling efficiencies (i.e., $η_1$ and $η_2$), yet the conventional linear-transmission calibration method recovers only their product (i.e., $η_1\,η_2$) and therefore introduces systematic bias when inferring on-chip performance from off-chip data. We present bidirectional nonlinear optical tomography (BNOT), a direction-aware metrology that uses forward and backward pumping of complementary nonlinear probes, with process-appropriate detection, to break the ``degeneracy'' of $η_1\,η_2$ and estimate individual interface efficiencies with tight confidence intervals. The method links off-chip measurements to on-chip quantities through a compact observation model that explicitly incorporates pump fluctuations and detector noise, and it frames efficiency extraction as a joint constrained optimization. Monte Carlo studies show unbiased convergence of the estimated efficiencies to ground truth with low error across realistic operating regimes. Using these efficiency estimates to reconstruct on-chip nonlinear figures of merit yields distributions centered on the true values with reduced variance, whereas conventional ``degenerate'' calibration is biased and can substantially misestimate on-chip performance. BNOT is hardware-compatible and platform-agnostic, and provides unbiased characterization of off- and on-chip coupling efficiencies across nonlinear processes, enabling reproducible, coupling-resolved benchmarking for scalable systems in quantum optics, frequency conversion, and precision metrology.
format Preprint
id arxiv_https___arxiv_org_abs_2510_13110
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Breaking On/Off-coupling Loss Degeneracies via Bidirectional Nonlinear Optics
Wu, Bo-Han
Mehrabad, Mahmoud Jalali
Yu, Mengjie
Englund, Dirk
Optics
Adaptation and Self-Organizing Systems
Quantum Physics
Accurate evaluation of nonlinear photonic integrated circuits requires separating input and output coupling efficiencies (i.e., $η_1$ and $η_2$), yet the conventional linear-transmission calibration method recovers only their product (i.e., $η_1\,η_2$) and therefore introduces systematic bias when inferring on-chip performance from off-chip data. We present bidirectional nonlinear optical tomography (BNOT), a direction-aware metrology that uses forward and backward pumping of complementary nonlinear probes, with process-appropriate detection, to break the ``degeneracy'' of $η_1\,η_2$ and estimate individual interface efficiencies with tight confidence intervals. The method links off-chip measurements to on-chip quantities through a compact observation model that explicitly incorporates pump fluctuations and detector noise, and it frames efficiency extraction as a joint constrained optimization. Monte Carlo studies show unbiased convergence of the estimated efficiencies to ground truth with low error across realistic operating regimes. Using these efficiency estimates to reconstruct on-chip nonlinear figures of merit yields distributions centered on the true values with reduced variance, whereas conventional ``degenerate'' calibration is biased and can substantially misestimate on-chip performance. BNOT is hardware-compatible and platform-agnostic, and provides unbiased characterization of off- and on-chip coupling efficiencies across nonlinear processes, enabling reproducible, coupling-resolved benchmarking for scalable systems in quantum optics, frequency conversion, and precision metrology.
title Breaking On/Off-coupling Loss Degeneracies via Bidirectional Nonlinear Optics
topic Optics
Adaptation and Self-Organizing Systems
Quantum Physics
url https://arxiv.org/abs/2510.13110