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Main Authors: Li, Jiayang, Zhang, Qingyu, Ha, Sohmyung, Demosthenous, Andreas, Jiang, Dai, Wu, Yu
Format: Preprint
Published: 2025
Subjects:
Online Access:https://arxiv.org/abs/2510.13682
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_version_ 1866915641604177920
author Li, Jiayang
Zhang, Qingyu
Ha, Sohmyung
Demosthenous, Andreas
Jiang, Dai
Wu, Yu
author_facet Li, Jiayang
Zhang, Qingyu
Ha, Sohmyung
Demosthenous, Andreas
Jiang, Dai
Wu, Yu
contents This paper presents a fast impedance measurement IC for large-scale piezo-resistive sensor array. It features a unified differential time-to-digital demodulation architecture that readout impedance directly through the excitation circuit. The proposed pre-saturation adaptive bias technique further improves power efficiency. The chip scans 253 sensors in 12.2 ms (82 fps) at 125 kHz, consuming 158 $μ$W (7.5 nJ/sensor). With loads from 20 $Ω$ to 500 k$Ω$, it achieves 0.5% error and up to 71.1 dB SNR.
format Preprint
id arxiv_https___arxiv_org_abs_2510_13682
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle A 0.62 $μ$W/sensor 82 fps Time-to-Digital Impedance Measurement IC with Unified Excitation/Readout Front-end for Large-Scale Piezo-Resistive Sensor Array
Li, Jiayang
Zhang, Qingyu
Ha, Sohmyung
Demosthenous, Andreas
Jiang, Dai
Wu, Yu
Systems and Control
This paper presents a fast impedance measurement IC for large-scale piezo-resistive sensor array. It features a unified differential time-to-digital demodulation architecture that readout impedance directly through the excitation circuit. The proposed pre-saturation adaptive bias technique further improves power efficiency. The chip scans 253 sensors in 12.2 ms (82 fps) at 125 kHz, consuming 158 $μ$W (7.5 nJ/sensor). With loads from 20 $Ω$ to 500 k$Ω$, it achieves 0.5% error and up to 71.1 dB SNR.
title A 0.62 $μ$W/sensor 82 fps Time-to-Digital Impedance Measurement IC with Unified Excitation/Readout Front-end for Large-Scale Piezo-Resistive Sensor Array
topic Systems and Control
url https://arxiv.org/abs/2510.13682