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Unveiling Retention Loss Mechanism in FeFETs with Gate-side Interlayer by Decoupling Trapped Charges and Ferroelectric Polarization

Fuente: arXiv
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Bibliographic Details
Main Authors: Han, Runhao, Hu, Tao, Yang, Jia, Dai, Saifei, Ding, Yajing, Bai, Mingkai, Shao, Xianzhou, Chai, Junshuai, Xu, Hao, Luo, Qing, Wang, Wenwu, Ye, Tianchun, Wang, Xiaolei
Format: Preprint
Published: 2025
Subjects:
Applied Physics
Online Access:
Acceder al recurso
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