Fault Cause Identification across Manufacturing Lines through Ontology-Guided and Process-Aware FMEA Graph Learning with LLMs

Fuente: arXiv

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Bibliographic Details
Main Authors:	Okazaki, Sho, Kaminishi, Kohei, Fujiu, Takuma, Wang, Yusheng, Ota, Jun
Format:	Preprint
Published:	2025
Subjects:	Information Retrieval
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2510.15428