Growth and microwave properties of FeSe thin films and comparison with Fe(Se,Te)

Fuente: arXiv
Enregistré dans:
Détails bibliographiques
Auteurs principaux: Magalotti, Alessandro, Alimenti, Andrea, Braccini, Valeria, Celentano, Giuseppe, Cialone, Matteo, Mancini, Antonella, Masi, Andrea, Pompeo, Nicola, Silva, Enrico, Sotgiu, Giovanni, Torokhtii, Kostiantyn, García, Pablo Vidal, Vannozzi, Angelo
Format: Preprint
Publié: 2025
Sujets:
Accès en ligne:
Tags: Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
_version_ 1866917337038323712
author Magalotti, Alessandro
Alimenti, Andrea
Braccini, Valeria
Celentano, Giuseppe
Cialone, Matteo
Mancini, Antonella
Masi, Andrea
Pompeo, Nicola
Silva, Enrico
Sotgiu, Giovanni
Torokhtii, Kostiantyn
García, Pablo Vidal
Vannozzi, Angelo
author_facet Magalotti, Alessandro
Alimenti, Andrea
Braccini, Valeria
Celentano, Giuseppe
Cialone, Matteo
Mancini, Antonella
Masi, Andrea
Pompeo, Nicola
Silva, Enrico
Sotgiu, Giovanni
Torokhtii, Kostiantyn
García, Pablo Vidal
Vannozzi, Angelo
contents In this work, we have grown $\sim$100 nm thick pristine FeSe films by pulsed laser deposition. The films were structurally characterized with X-ray diffraction and their surface morphology checked through atomic force microscopy. Microwave measurements, performed with a dielectric loaded resonator tuned at the frequency of 8 GHz, allowed the characterization of the samples surface resistance, in view of potential applications in microwave haloscopes for dark matter search. Here, we report the comparison of the microwave properties of FeSe with Fe(Se,Te) thin films, as the temperature is swept from 4 K to 20 K. By applying a constant static magnetic field of 12 T, it was also possible to discern the magnetic field resilience of the two samples. FeSe showed a larger critical temperature drift as the field is applied, while the Fe(Se,Te) response broadens remarkably less. A preliminary analysis of vortex pinning shows margins for optimizing pinning in FeSe.
format Preprint
id arxiv_https___arxiv_org_abs_2510_15537
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Growth and microwave properties of FeSe thin films and comparison with Fe(Se,Te)
Magalotti, Alessandro
Alimenti, Andrea
Braccini, Valeria
Celentano, Giuseppe
Cialone, Matteo
Mancini, Antonella
Masi, Andrea
Pompeo, Nicola
Silva, Enrico
Sotgiu, Giovanni
Torokhtii, Kostiantyn
García, Pablo Vidal
Vannozzi, Angelo
Superconductivity
In this work, we have grown $\sim$100 nm thick pristine FeSe films by pulsed laser deposition. The films were structurally characterized with X-ray diffraction and their surface morphology checked through atomic force microscopy. Microwave measurements, performed with a dielectric loaded resonator tuned at the frequency of 8 GHz, allowed the characterization of the samples surface resistance, in view of potential applications in microwave haloscopes for dark matter search. Here, we report the comparison of the microwave properties of FeSe with Fe(Se,Te) thin films, as the temperature is swept from 4 K to 20 K. By applying a constant static magnetic field of 12 T, it was also possible to discern the magnetic field resilience of the two samples. FeSe showed a larger critical temperature drift as the field is applied, while the Fe(Se,Te) response broadens remarkably less. A preliminary analysis of vortex pinning shows margins for optimizing pinning in FeSe.
title Growth and microwave properties of FeSe thin films and comparison with Fe(Se,Te)
topic Superconductivity
url https://arxiv.org/abs/2510.15537