Quantifying non-Gaussian diffusion in transient microscopy using excess kurtosis
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arXiv
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| Auteurs principaux: | , , , |
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| Format: | Preprint |
| Publié: |
2025
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| _version_ | 1866914202353926144 |
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| author | Rodríguez, Enrique Arévalo Schofield, Marc Meléndez Cuadra, Jorge Prins, Ferry |
| author_facet | Rodríguez, Enrique Arévalo Schofield, Marc Meléndez Cuadra, Jorge Prins, Ferry |
| contents | Research on energy transport has advanced in recent years with the emergence of transient microscopy techniques that allow for imaging of carriers with high spatial and temporal resolution. In this context, transient scattering microscopy (TScM), has emerged as an alternative to traditional techniques. However, the sensitivity of TScM to different carriers can complicate the interpretation of results, highlighting the need to develop models tailored to TScM. Here, TScM is used to visualize exciton transport in bulk TMDCs. We show that exciton populations exhibit non-Gaussian profiles by analyzing the their excess kurtosis. Numerical simulations incorporating anomalous diffusion -- such as Auger recombination and trap states -- reproduce these experimental observations. Furthermore, by tuning the injected carrier density, we demonstrate that the temporal signature of the kurtosis is distinct for Auger-dominated and trap-dominated regimes. Additionally, we find that traditional Gaussian-fitting methods can yield inconsistent results for the extracted diffusivities. As an alternative, we implement a discrete variable calculation which yields robust, consistent diffusivity values. Our results establish kurtosis as a vital diagnostic parameter for identifying anomolous diffusion and demonstrate the necessity of moving beyond Gaussian approximations for accurate analysis of TScM data. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2510_15587 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Quantifying non-Gaussian diffusion in transient microscopy using excess kurtosis Rodríguez, Enrique Arévalo Schofield, Marc Meléndez Cuadra, Jorge Prins, Ferry Materials Science Research on energy transport has advanced in recent years with the emergence of transient microscopy techniques that allow for imaging of carriers with high spatial and temporal resolution. In this context, transient scattering microscopy (TScM), has emerged as an alternative to traditional techniques. However, the sensitivity of TScM to different carriers can complicate the interpretation of results, highlighting the need to develop models tailored to TScM. Here, TScM is used to visualize exciton transport in bulk TMDCs. We show that exciton populations exhibit non-Gaussian profiles by analyzing the their excess kurtosis. Numerical simulations incorporating anomalous diffusion -- such as Auger recombination and trap states -- reproduce these experimental observations. Furthermore, by tuning the injected carrier density, we demonstrate that the temporal signature of the kurtosis is distinct for Auger-dominated and trap-dominated regimes. Additionally, we find that traditional Gaussian-fitting methods can yield inconsistent results for the extracted diffusivities. As an alternative, we implement a discrete variable calculation which yields robust, consistent diffusivity values. Our results establish kurtosis as a vital diagnostic parameter for identifying anomolous diffusion and demonstrate the necessity of moving beyond Gaussian approximations for accurate analysis of TScM data. |
| title | Quantifying non-Gaussian diffusion in transient microscopy using excess kurtosis |
| topic | Materials Science |
| url | https://arxiv.org/abs/2510.15587 |