Trapped-ion two-qubit gates with >99.99% fidelity without ground-state cooling

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Hughes, A. C., Srinivas, R., Löschnauer, C. M., Knaack, H. M., Matt, R., Ballance, C. J., Malinowski, M., Harty, T. P., Sutherland, R. T.
Format: Preprint
Published: 2025
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!