Universal loss and gain characterization inside photonic integrated circuits

Fuente: arXiv

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Bibliographic Details
Main Authors:	Chen, Haoran, Liu, Ruxuan, Koehler, Gedalia Y., Tabatabaei, Fatemehsadat, Guo, Xiangwen, Sun, Shuman, Yang, Zijiao, Wang, Beichen, Beling, Andreas, Yi, Xu
Format:	Preprint
Published:	2025
Subjects:	Optics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2510.18198