Universal loss and gain characterization inside photonic integrated circuits
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arXiv
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| Auteurs principaux: | , , , , , , , , , |
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| Format: | Preprint |
| Publié: |
2025
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| _version_ | 1866912662587179008 |
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| author | Chen, Haoran Liu, Ruxuan Koehler, Gedalia Y. Tabatabaei, Fatemehsadat Guo, Xiangwen Sun, Shuman Yang, Zijiao Wang, Beichen Beling, Andreas Yi, Xu |
| author_facet | Chen, Haoran Liu, Ruxuan Koehler, Gedalia Y. Tabatabaei, Fatemehsadat Guo, Xiangwen Sun, Shuman Yang, Zijiao Wang, Beichen Beling, Andreas Yi, Xu |
| contents | Integrated photonics has undergone tremendous development in the past few decades, transforming many fields of study in science and technology. Loss and gain are two fundamental elements in photonic circuits and have direct impacts on nearly all key performance metrics. Surprisingly, the tools to characterize the optical loss and gain inside photonic integrated circuits (PICs) are very limited. This is because, unlike free-space or fiber optics, integrated circuits cannot be nondestructively disassembled. Here, we report a universal method to see inside the photonic integrated circuits and measure loss and gain on the component level nondestructively. The method leverages nonlinear optical devices as optical power discriminators to retrieve the loss and gain information inside the PICs. Our method has a precision better than 0.1 dB, and can characterize the loss of individual fiber-chip coupling facet and general unknown devices under test. As a demonstration of applications, we measured the true on-chip quantum efficiency of a quantum PIC consisting of heterogeneously integrated balanced photodiodes, a critical building block for integrated quantum technology. Our method can be implemented on different photonic platforms, and can be used to understand gain and loss in complex photonic circuits, which is essential to optimize circuit design and to create large-scale systems with predictable, reproducible performance. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2510_18198 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Universal loss and gain characterization inside photonic integrated circuits Chen, Haoran Liu, Ruxuan Koehler, Gedalia Y. Tabatabaei, Fatemehsadat Guo, Xiangwen Sun, Shuman Yang, Zijiao Wang, Beichen Beling, Andreas Yi, Xu Optics Integrated photonics has undergone tremendous development in the past few decades, transforming many fields of study in science and technology. Loss and gain are two fundamental elements in photonic circuits and have direct impacts on nearly all key performance metrics. Surprisingly, the tools to characterize the optical loss and gain inside photonic integrated circuits (PICs) are very limited. This is because, unlike free-space or fiber optics, integrated circuits cannot be nondestructively disassembled. Here, we report a universal method to see inside the photonic integrated circuits and measure loss and gain on the component level nondestructively. The method leverages nonlinear optical devices as optical power discriminators to retrieve the loss and gain information inside the PICs. Our method has a precision better than 0.1 dB, and can characterize the loss of individual fiber-chip coupling facet and general unknown devices under test. As a demonstration of applications, we measured the true on-chip quantum efficiency of a quantum PIC consisting of heterogeneously integrated balanced photodiodes, a critical building block for integrated quantum technology. Our method can be implemented on different photonic platforms, and can be used to understand gain and loss in complex photonic circuits, which is essential to optimize circuit design and to create large-scale systems with predictable, reproducible performance. |
| title | Universal loss and gain characterization inside photonic integrated circuits |
| topic | Optics |
| url | https://arxiv.org/abs/2510.18198 |