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Robust Material Properties in Epitaxial In$_2$Te$_3$ Thin Films Across Varying Thicknesses

Fuente: arXiv
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Bibliographic Details
Main Authors: Buchta, Maximilian, Hoff, Felix, Bothe, Lucas, Penner, Niklas, Ringkamp, Christoph, Schmidt, Thomas, Veslin, Timo, Mak, Ka Lei, Frank, Jonathan, Kim, Dasol, Wuttig, Matthias
Format: Preprint
Published: 2025
Subjects:
Materials Science
Online Access:
Acceder al recurso
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