Universal Thickness-Dependent Absorption in Solids at the Nanoscale

Fuente: arXiv
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Hauptverfasser: Chauhan, Bhumika, Singh, Nikhil, Dalai, Subhrajit, Saidarsan, Abhisek, Patra, Sayantan, Jain, Sourabh, Deshpande, Aparna, Arora, Ashish
Format: Preprint
Veröffentlicht: 2025
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author Chauhan, Bhumika
Singh, Nikhil
Dalai, Subhrajit
Saidarsan, Abhisek
Patra, Sayantan
Jain, Sourabh
Deshpande, Aparna
Arora, Ashish
author_facet Chauhan, Bhumika
Singh, Nikhil
Dalai, Subhrajit
Saidarsan, Abhisek
Patra, Sayantan
Jain, Sourabh
Deshpande, Aparna
Arora, Ashish
contents Through systematic experimental and theoretical studies of layer-thickness-dependent absorption in semiconducting MoSe$_2$ and WS$_2$ across the visible to near-infrared spectral range, we demonstrate a universal absorption behavior in solids at nanoscale thicknesses. With increasing thickness, a non-monotonic evolution of absorption integrated over the measured spectral region is revealed which is accompanied by pronounced oscillatory features. This strongly deviates from the expected Beer-Lambert law. The observed behavior has origins in the electromagnetic interference effects taking place between the two surfaces of the thin crystals. The present work on 2D semiconductors is extendable to all kinds of solids such as conventional semiconductors (e.g. Si, GaAs, GaN, InP), (semi)metals (e.g. Al, Ag, Au, c-HOPG) and 2D magnetic materials (e.g. CrSBr and NiPS$_3$). Our results provide fundamental insights into light-matter interactions in solids at the nanoscale and are vital for optimally designing the new generation of absorption-based flexible optoelectronic devices.
format Preprint
id arxiv_https___arxiv_org_abs_2510_21354
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Universal Thickness-Dependent Absorption in Solids at the Nanoscale
Chauhan, Bhumika
Singh, Nikhil
Dalai, Subhrajit
Saidarsan, Abhisek
Patra, Sayantan
Jain, Sourabh
Deshpande, Aparna
Arora, Ashish
Mesoscale and Nanoscale Physics
Optics
Through systematic experimental and theoretical studies of layer-thickness-dependent absorption in semiconducting MoSe$_2$ and WS$_2$ across the visible to near-infrared spectral range, we demonstrate a universal absorption behavior in solids at nanoscale thicknesses. With increasing thickness, a non-monotonic evolution of absorption integrated over the measured spectral region is revealed which is accompanied by pronounced oscillatory features. This strongly deviates from the expected Beer-Lambert law. The observed behavior has origins in the electromagnetic interference effects taking place between the two surfaces of the thin crystals. The present work on 2D semiconductors is extendable to all kinds of solids such as conventional semiconductors (e.g. Si, GaAs, GaN, InP), (semi)metals (e.g. Al, Ag, Au, c-HOPG) and 2D magnetic materials (e.g. CrSBr and NiPS$_3$). Our results provide fundamental insights into light-matter interactions in solids at the nanoscale and are vital for optimally designing the new generation of absorption-based flexible optoelectronic devices.
title Universal Thickness-Dependent Absorption in Solids at the Nanoscale
topic Mesoscale and Nanoscale Physics
Optics
url https://arxiv.org/abs/2510.21354