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Main Authors: Chiu, Wei-en, Huang, Chia-Hsien, Wu, Yi-Hsien, Goan, Hsi-Sheng
Format: Preprint
Published: 2025
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Online Access:https://arxiv.org/abs/2510.22189
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author Chiu, Wei-en
Huang, Chia-Hsien
Wu, Yi-Hsien
Goan, Hsi-Sheng
author_facet Chiu, Wei-en
Huang, Chia-Hsien
Wu, Yi-Hsien
Goan, Hsi-Sheng
contents In Si/SiGe quantum dots, the decoherence behavior of spin qubits usually comes from the non-Markovian effect of the charge noise. To improve the performance of using the coherent noise models in the decoherence simulation and tomography analysis, here we propose a spin-phonon model derived from the electric dipole spin resonance to characterize the decoherence behavior of the spin qubit in a Si/SiGe quantum dot. Utilizing a 1/f spectrum to characterize quantum noise correlation, our stochastic model can yield a more precise prediction of decoherence compared to a random coherence model. We also use gate set tomography (GST) to address the error generator and analyze the model violation coming from the non-Markovian effect. Based on the results, we attribute certain error generators of this model to the incoherence error, which avoids the scenario of using too large a coherent noise strength in the previous study to account for the experimentally observed decoherence times, and thus underestimates the gate fidelity. We also perform a gate optimization and show that our optimized control pulse can substantially reduce the error contribution of the incoherent non-Markovian 1/f charge noise. We further demonstrate that the optimized pulse against incoherent noise is more robust against coherent noise than the regular Gaussian pulse through a filter function analysis in a CPMG protocol, demonstrating the significant effectiveness of the optimized pulse.
format Preprint
id arxiv_https___arxiv_org_abs_2510_22189
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Effect of Stochastic Charge Noise in Si/SiGe Quantum-Dot Spin Qubits
Chiu, Wei-en
Huang, Chia-Hsien
Wu, Yi-Hsien
Goan, Hsi-Sheng
Quantum Physics
In Si/SiGe quantum dots, the decoherence behavior of spin qubits usually comes from the non-Markovian effect of the charge noise. To improve the performance of using the coherent noise models in the decoherence simulation and tomography analysis, here we propose a spin-phonon model derived from the electric dipole spin resonance to characterize the decoherence behavior of the spin qubit in a Si/SiGe quantum dot. Utilizing a 1/f spectrum to characterize quantum noise correlation, our stochastic model can yield a more precise prediction of decoherence compared to a random coherence model. We also use gate set tomography (GST) to address the error generator and analyze the model violation coming from the non-Markovian effect. Based on the results, we attribute certain error generators of this model to the incoherence error, which avoids the scenario of using too large a coherent noise strength in the previous study to account for the experimentally observed decoherence times, and thus underestimates the gate fidelity. We also perform a gate optimization and show that our optimized control pulse can substantially reduce the error contribution of the incoherent non-Markovian 1/f charge noise. We further demonstrate that the optimized pulse against incoherent noise is more robust against coherent noise than the regular Gaussian pulse through a filter function analysis in a CPMG protocol, demonstrating the significant effectiveness of the optimized pulse.
title Effect of Stochastic Charge Noise in Si/SiGe Quantum-Dot Spin Qubits
topic Quantum Physics
url https://arxiv.org/abs/2510.22189