Understanding Self-Admitted Technical Debt in Test Code: An Empirical Study

Fuente: arXiv

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Bibliographic Details
Main Authors:	Nakamura, Ibuki, Kashiwa, Yutaro, Lin, Bin, Iida, Hajimu
Format:	Preprint
Published:	2025
Subjects:	Software Engineering
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2510.22249