Is Your Prompt Poisoning Code? Defect Induction Rates and Security Mitigation Strategies

Fuente: arXiv

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Bibliographic Details
Main Authors:	Wang, Bin, Zhong, YiLu, Wan, MiDi, Yu, WenJie, Ouyang, YuanBing, Huang, Yenan, Li, Hui
Format:	Preprint
Published:	2025
Subjects:	Cryptography and Security Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2510.22944