Charge Trap Analysis in a SENSEI Skipper-CCD: Understanding Low-Energy Backgrounds in Rare-Event Searches
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arXiv
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| Autori principali: | , , , , , , , , , , , , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2025
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| _version_ | 1866912672494125056 |
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| author | Brusco, Agustin Sivilotti, Bruno Botti, Ana M. Cervantes, Brenda Desai, Ansh Essig, Rouven Estrada, Juan Etzion, Erez Moroni, Guillermo Fernandez Holland, Stephen E. Lawson, Ian Luoma, Steffon Perez, Santiago E. Rodrigues, Dario Tiffenberg, Javier Uemura, Sho Wu, Yikai |
| author_facet | Brusco, Agustin Sivilotti, Bruno Botti, Ana M. Cervantes, Brenda Desai, Ansh Essig, Rouven Estrada, Juan Etzion, Erez Moroni, Guillermo Fernandez Holland, Stephen E. Lawson, Ian Luoma, Steffon Perez, Santiago E. Rodrigues, Dario Tiffenberg, Javier Uemura, Sho Wu, Yikai |
| contents | Skipper Charge-Coupled Devices (Skipper-CCDs) are ultra-low-threshold detectors capable of detecting energy deposits in silicon at the eV scale. Increasingly used in rare-event searches, one of the major challenges in these experiments is mitigating low-energy backgrounds. In this work, we present results on trap characterization in a silicon Skipper-CCD produced in the same fabrication run as the SENSEI experiment at SNOLAB. Lattice defects contribute to backgrounds in rare-event searches through single-electron charge trapping. To investigate this, we employ the charge-pumping technique at different temperatures to identify dipoles produced by traps in the CCD channel. We fully characterize a fraction of these traps and use this information to extrapolate their contribution to the single-electron background in SENSEI. We find that this subpopulation of traps does not contribute significantly but more work is needed to assess the impact of the traps that can not be characterized. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2510_23336 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Charge Trap Analysis in a SENSEI Skipper-CCD: Understanding Low-Energy Backgrounds in Rare-Event Searches Brusco, Agustin Sivilotti, Bruno Botti, Ana M. Cervantes, Brenda Desai, Ansh Essig, Rouven Estrada, Juan Etzion, Erez Moroni, Guillermo Fernandez Holland, Stephen E. Lawson, Ian Luoma, Steffon Perez, Santiago E. Rodrigues, Dario Tiffenberg, Javier Uemura, Sho Wu, Yikai High Energy Physics - Experiment Instrumentation and Methods for Astrophysics Skipper Charge-Coupled Devices (Skipper-CCDs) are ultra-low-threshold detectors capable of detecting energy deposits in silicon at the eV scale. Increasingly used in rare-event searches, one of the major challenges in these experiments is mitigating low-energy backgrounds. In this work, we present results on trap characterization in a silicon Skipper-CCD produced in the same fabrication run as the SENSEI experiment at SNOLAB. Lattice defects contribute to backgrounds in rare-event searches through single-electron charge trapping. To investigate this, we employ the charge-pumping technique at different temperatures to identify dipoles produced by traps in the CCD channel. We fully characterize a fraction of these traps and use this information to extrapolate their contribution to the single-electron background in SENSEI. We find that this subpopulation of traps does not contribute significantly but more work is needed to assess the impact of the traps that can not be characterized. |
| title | Charge Trap Analysis in a SENSEI Skipper-CCD: Understanding Low-Energy Backgrounds in Rare-Event Searches |
| topic | High Energy Physics - Experiment Instrumentation and Methods for Astrophysics |
| url | https://arxiv.org/abs/2510.23336 |