Explainable Detection of AI-Generated Images with Artifact Localization Using Faster-Than-Lies and Vision-Language Models for Edge Devices

Fuente: arXiv
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Bibliographic Details
Main Authors: Mathur, Aryan, Ahmed, Asaduddin, Vasoya, Pushti Amit, Sonar, Simeon Kandan, Z, Yasir, Kuppusamy, Madesh
Format: Preprint
Published: 2025
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