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Thickness dependent rare earth segregation in magnetron deposited NdCo$_{4.6}$ thin films studied by Xray reflectivity and Hard Xray photoemission

Fuente: arXiv

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Bibliographic Details
Main Authors:	Díaz, J., Rodríguez-Fernández, J., Rubio-Zuazo, J.
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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