Thickness dependent rare earth segregation in magnetron deposited NdCo$_{4.6}$ thin films studied by Xray reflectivity and Hard Xray photoemission

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Díaz, J., Rodríguez-Fernández, J., Rubio-Zuazo, J.
Format: Preprint
Published: 2025
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!