Development of a new phase-retrieval algorithm from a single-shot image for X-ray schlieren microscopy
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| Main Authors: | , , , , , , , |
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| Format: | Preprint |
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2025
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| _version_ | 1866909875818201088 |
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| author | Nishimura, Ryutaro Suzuki, Yoshio Sugiyama, Hiroshi Wakabayashi, Daisuke Shibazaki, Yuki Hirano, Keiichi Igarashi, Noriyuki Funamori, Nobumasa |
| author_facet | Nishimura, Ryutaro Suzuki, Yoshio Sugiyama, Hiroshi Wakabayashi, Daisuke Shibazaki, Yuki Hirano, Keiichi Igarashi, Noriyuki Funamori, Nobumasa |
| contents | In this paper, a new phase-retrieval algorithm from an X-ray schlieren image is proposed. The schlieren method allows phase-contrast imaging with an objective lens and a knife-edge filter placed at the back focal plane of the objective. This method finds a wide range of applications in the visible-light region for transparent specimen visualization. The schlieren contrast does not directly correspond to the phase shift. However, the phase map can be reconstructed from a single-shot schlieren image of a transparent and weak-phase object using the filtered Fourier transform method. A proof-of-principle experiment was performed in the hard-X-ray region at the AR-NE1A beamline of the Photon Factory facility at the High Energy Accelerator Research Organization (KEK). |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2510_25264 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Development of a new phase-retrieval algorithm from a single-shot image for X-ray schlieren microscopy Nishimura, Ryutaro Suzuki, Yoshio Sugiyama, Hiroshi Wakabayashi, Daisuke Shibazaki, Yuki Hirano, Keiichi Igarashi, Noriyuki Funamori, Nobumasa Instrumentation and Detectors Data Analysis, Statistics and Probability Optics In this paper, a new phase-retrieval algorithm from an X-ray schlieren image is proposed. The schlieren method allows phase-contrast imaging with an objective lens and a knife-edge filter placed at the back focal plane of the objective. This method finds a wide range of applications in the visible-light region for transparent specimen visualization. The schlieren contrast does not directly correspond to the phase shift. However, the phase map can be reconstructed from a single-shot schlieren image of a transparent and weak-phase object using the filtered Fourier transform method. A proof-of-principle experiment was performed in the hard-X-ray region at the AR-NE1A beamline of the Photon Factory facility at the High Energy Accelerator Research Organization (KEK). |
| title | Development of a new phase-retrieval algorithm from a single-shot image for X-ray schlieren microscopy |
| topic | Instrumentation and Detectors Data Analysis, Statistics and Probability Optics |
| url | https://arxiv.org/abs/2510.25264 |