APA (7th ed.) Citation

Zhang, X., Gao, T., Jin, S., Wang, T., Ye, T., Adar, E., & Mei, Q. (2025). Through the Judge's Eyes: Inferred Thinking Traces Improve Reliability of LLM Raters.

Chicago Style (17th ed.) Citation

Zhang, Xingjian, Tianhong Gao, Suliang Jin, Tianhao Wang, Teng Ye, Eytan Adar, and Qiaozhu Mei. Through the Judge's Eyes: Inferred Thinking Traces Improve Reliability of LLM Raters. 2025.

MLA (9th ed.) Citation

Zhang, Xingjian, et al. Through the Judge's Eyes: Inferred Thinking Traces Improve Reliability of LLM Raters. 2025.