Characterization of heat transfer in 3D CMOS structures using Sideband Scanning Thermal Wave Microscopy

Documenti analoghi

• Sideband Spectroscopy in the Strong Driving Regime: Volcano Transparency and Sideband Anomaly
  di: Antonic, Luka, et al.
  Pubblicazione: (2025)
• One-way heat transfer in deep-subwavelength thermophotonics
  di: Yang, Shuihua, et al.
  Pubblicazione: (2024)
• Direct measurement of the local electrocaloric effect in 2D ferroelectric In${}_2$Se${}_3$ by Scanning Electrocaloric Thermometry
  di: Spièce, Jean, et al.
  Pubblicazione: (2024)
• Direct Measurement of the Local Electrocaloric Effect in 2D α‐In 2 Se 3 by Scanning Electrocaloric Thermometry
  di: Jean Spièce, et al.
  Pubblicazione: (2025)
• A Rapid-prototyping CMOS-RRAM Integration Strategy
  di: Tsiamis, Andreas, et al.
  Pubblicazione: (2025)