Kinematical and dynamical contrast of dislocations in thick GaN substrates observed by synchrotron-radiation X-ray topography under six-beam diffraction conditions

Fuente: arXiv

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Bibliographic Details
Main Authors:	Yao, Yongzhao, Tsusaka, Yoshiyuki, Ishikawa, Yukari
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2510.27597