Yuan, H., Liu, Y., Wang, L., Dong, Z., Yang, J., & Chen, Z. (2025). Atomic-Scale Roughness of Freestanding Oxide Membranes Revealed by Electron Ptychography.
Style de citation Chicago (17e éd.)Yuan, Huaicheng, Yu-Chen Liu, Li-Shu Wang, Zehao Dong, Jan-Chi Yang, et Zhen Chen. Atomic-Scale Roughness of Freestanding Oxide Membranes Revealed by Electron Ptychography. 2025.
Style de citation MLA (9e éd.)Yuan, Huaicheng, et al. Atomic-Scale Roughness of Freestanding Oxide Membranes Revealed by Electron Ptychography. 2025.
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