Cita APA (7a ed.)

Yuan, H., Liu, Y., Wang, L., Dong, Z., Yang, J., & Chen, Z. (2025). Atomic-Scale Roughness of Freestanding Oxide Membranes Revealed by Electron Ptychography.

Cita Chicago Style (17a ed.)

Yuan, Huaicheng, Yu-Chen Liu, Li-Shu Wang, Zehao Dong, Jan-Chi Yang, y Zhen Chen. Atomic-Scale Roughness of Freestanding Oxide Membranes Revealed by Electron Ptychography. 2025.

Cita MLA (9a ed.)

Yuan, Huaicheng, et al. Atomic-Scale Roughness of Freestanding Oxide Membranes Revealed by Electron Ptychography. 2025.