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Atomic-Scale Roughness of Freestanding Oxide Membranes Revealed by Electron Ptychography

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Yuan, Huaicheng, Liu, Yu-Chen, Wang, Li-Shu, Dong, Zehao, Yang, Jan-Chi, Chen, Zhen
Formato:	Preprint
Publicado:	2025
Materias:	Materials Science Mesoscale and Nanoscale Physics Strongly Correlated Electrons
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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