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Atomic-Scale Roughness of Freestanding Oxide Membranes Revealed by Electron Ptychography

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Yuan, Huaicheng, Liu, Yu-Chen, Wang, Li-Shu, Dong, Zehao, Yang, Jan-Chi, Chen, Zhen
Format:	Preprint
Publié:	2025
Sujets:	Materials Science Mesoscale and Nanoscale Physics Strongly Correlated Electrons
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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