Real-IAD Variety: Pushing Industrial Anomaly Detection Dataset to a Modern Era

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Hauptverfasser: Zhu, Wenbing, Wang, Chengjie, Gao, Bin-Bin, Zhang, Jiangning, Jiang, Guannan, Hu, Jie, Gan, Zhenye, Wang, Lidong, Zhou, Ziqing, Zhang, Jianghui, Cheng, Linjie, Pan, Yurui, Peng, Bo, Chi, Mingmin, Ma, Lizhuang
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Veröffentlicht: 2025
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author Zhu, Wenbing
Wang, Chengjie
Gao, Bin-Bin
Zhang, Jiangning
Jiang, Guannan
Hu, Jie
Gan, Zhenye
Wang, Lidong
Zhou, Ziqing
Zhang, Jianghui
Cheng, Linjie
Pan, Yurui
Peng, Bo
Chi, Mingmin
Ma, Lizhuang
author_facet Zhu, Wenbing
Wang, Chengjie
Gao, Bin-Bin
Zhang, Jiangning
Jiang, Guannan
Hu, Jie
Gan, Zhenye
Wang, Lidong
Zhou, Ziqing
Zhang, Jianghui
Cheng, Linjie
Pan, Yurui
Peng, Bo
Chi, Mingmin
Ma, Lizhuang
contents Industrial Anomaly Detection (IAD) is a cornerstone for ensuring operational safety, maintaining product quality, and optimizing manufacturing efficiency. However, the advancement of IAD algorithms is severely hindered by the limitations of existing public benchmarks. Current datasets often suffer from restricted category diversity and insufficient scale, leading to performance saturation and poor model transferability in complex, real-world scenarios. To bridge this gap, we introduce Real-IAD Variety, the largest and most diverse IAD benchmark. It comprises 198,950 high-resolution images across 160 distinct object categories. The dataset ensures unprecedented diversity by covering 28 industries, 24 material types, 22 color variations, and 27 defect types. Our extensive experimental analysis highlights the substantial challenges posed by this benchmark: state-of-the-art multi-class unsupervised anomaly detection methods suffer significant performance degradation (ranging from 10% to 20%) when scaled from 30 to 160 categories. Conversely, we demonstrate that zero-shot and few-shot IAD models exhibit remarkable robustness to category scale-up, maintaining consistent performance and significantly enhancing generalization across diverse industrial contexts. This unprecedented scale positions Real-IAD Variety as an essential resource for training and evaluating next-generation foundation IAD models.
format Preprint
id arxiv_https___arxiv_org_abs_2511_00540
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Real-IAD Variety: Pushing Industrial Anomaly Detection Dataset to a Modern Era
Zhu, Wenbing
Wang, Chengjie
Gao, Bin-Bin
Zhang, Jiangning
Jiang, Guannan
Hu, Jie
Gan, Zhenye
Wang, Lidong
Zhou, Ziqing
Zhang, Jianghui
Cheng, Linjie
Pan, Yurui
Peng, Bo
Chi, Mingmin
Ma, Lizhuang
Computer Vision and Pattern Recognition
Industrial Anomaly Detection (IAD) is a cornerstone for ensuring operational safety, maintaining product quality, and optimizing manufacturing efficiency. However, the advancement of IAD algorithms is severely hindered by the limitations of existing public benchmarks. Current datasets often suffer from restricted category diversity and insufficient scale, leading to performance saturation and poor model transferability in complex, real-world scenarios. To bridge this gap, we introduce Real-IAD Variety, the largest and most diverse IAD benchmark. It comprises 198,950 high-resolution images across 160 distinct object categories. The dataset ensures unprecedented diversity by covering 28 industries, 24 material types, 22 color variations, and 27 defect types. Our extensive experimental analysis highlights the substantial challenges posed by this benchmark: state-of-the-art multi-class unsupervised anomaly detection methods suffer significant performance degradation (ranging from 10% to 20%) when scaled from 30 to 160 categories. Conversely, we demonstrate that zero-shot and few-shot IAD models exhibit remarkable robustness to category scale-up, maintaining consistent performance and significantly enhancing generalization across diverse industrial contexts. This unprecedented scale positions Real-IAD Variety as an essential resource for training and evaluating next-generation foundation IAD models.
title Real-IAD Variety: Pushing Industrial Anomaly Detection Dataset to a Modern Era
topic Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2511.00540