Investigating the Robustness of Knowledge Tracing Models in the Presence of Student Concept Drift

Fuente: arXiv
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Auteurs principaux: Lee, Morgan, Frenk, Artem, Worden, Eamon, Gupta, Karish, Pham, Thinh, Croteau, Ethan, Heffernan, Neil
Format: Preprint
Publié: 2025
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author Lee, Morgan
Frenk, Artem
Worden, Eamon
Gupta, Karish
Pham, Thinh
Croteau, Ethan
Heffernan, Neil
author_facet Lee, Morgan
Frenk, Artem
Worden, Eamon
Gupta, Karish
Pham, Thinh
Croteau, Ethan
Heffernan, Neil
contents Knowledge Tracing (KT) has been an established problem in the educational data mining field for decades, and it is commonly assumed that the underlying learning process being modeled remains static. Given the ever-changing landscape of online learning platforms (OLPs), we investigate how concept drift and changing student populations can impact student behavior within an OLP through testing model performance both within a single academic year and across multiple academic years. Four well-studied KT models were applied to five academic years of data to assess how susceptible KT models are to concept drift. Through our analysis, we find that all four families of KT models can exhibit degraded performance, Bayesian Knowledge Tracing (BKT) remains the most stable KT model when applied to newer data, while more complex, attention based models lose predictive power significantly faster.
format Preprint
id arxiv_https___arxiv_org_abs_2511_00704
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Investigating the Robustness of Knowledge Tracing Models in the Presence of Student Concept Drift
Lee, Morgan
Frenk, Artem
Worden, Eamon
Gupta, Karish
Pham, Thinh
Croteau, Ethan
Heffernan, Neil
Machine Learning
Knowledge Tracing (KT) has been an established problem in the educational data mining field for decades, and it is commonly assumed that the underlying learning process being modeled remains static. Given the ever-changing landscape of online learning platforms (OLPs), we investigate how concept drift and changing student populations can impact student behavior within an OLP through testing model performance both within a single academic year and across multiple academic years. Four well-studied KT models were applied to five academic years of data to assess how susceptible KT models are to concept drift. Through our analysis, we find that all four families of KT models can exhibit degraded performance, Bayesian Knowledge Tracing (BKT) remains the most stable KT model when applied to newer data, while more complex, attention based models lose predictive power significantly faster.
title Investigating the Robustness of Knowledge Tracing Models in the Presence of Student Concept Drift
topic Machine Learning
url https://arxiv.org/abs/2511.00704