Extending Reflectometry Range, A Zero-Crossing Algorithm for Thick Film Metrology

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhou, Zimu, Lopez-Guerra, Enrique, Zana, Iulica, Nguyen, Vu, Tran, Nguyen Quoc Huy, Zhou, Bojun, Qian, Gary, Kwan, Michael, Wilkens, Peter, Chien, Chester
Format:	Preprint
Published:	2025
Subjects:	Optics Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2511.02188