Cita APA (7a ed.)

Sheng, J., Yanagida, T. T., Gao, B., & Ding, H. (2025). Testing Electromagnetic Memory via Acceleration-Induced Phase Imprints in Superconductors.

Cita Chicago Style (17a ed.)

Sheng, Jie, Tsutomu T. Yanagida, Bo Gao, y Hong Ding. Testing Electromagnetic Memory via Acceleration-Induced Phase Imprints in Superconductors. 2025.

Cita MLA (9a ed.)

Sheng, Jie, et al. Testing Electromagnetic Memory via Acceleration-Induced Phase Imprints in Superconductors. 2025.