Sheng, J., Yanagida, T. T., Gao, B., & Ding, H. (2025). Testing Electromagnetic Memory via Acceleration-Induced Phase Imprints in Superconductors.
Chicago Style (17th ed.) CitationSheng, Jie, Tsutomu T. Yanagida, Bo Gao, and Hong Ding. Testing Electromagnetic Memory via Acceleration-Induced Phase Imprints in Superconductors. 2025.
MLA (9th ed.) CitationSheng, Jie, et al. Testing Electromagnetic Memory via Acceleration-Induced Phase Imprints in Superconductors. 2025.
Warning: These citations may not always be 100% accurate.