Yield and performance validation of the Monolithic Stitched Sensor (MOSS), the first wafer-scale prototype for the ALICE ITS3 upgrade

Fuente: arXiv

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Bibliographic Details
Main Author:	Menzel, Marius Wilm
Format:	Preprint
Published:	2025
Subjects:	Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2511.02403