Copertina

Unsupervised Learning for Industrial Defect Detection: A Case Study on Shearographic Data

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Plassmann, Jessica, Schuler, Nicolas, von Freymann, Georg, Schuth, Michael
Natura:	Preprint
Pubblicazione:	2025
Soggetti:	Computer Vision and Pattern Recognition
Accesso online:	Acceder al recurso
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