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Single-particle detection of a semiconductor-to-metal transition by scanning dielectric microscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Millan-Solsona, Ruben, Ruiz-Torres, José A., Moya, Carlos, Rodríguez, Arantxa Fraile, Figueroa, Adriana I., Gomila, Gabriel, Labarta, Amílcar, Batlle, Xavier
Format:	Preprint
Published:	2025
Subjects:	Chemical Physics
Online Access:	Acceder al recurso
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