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Critical Disconnect Between Structural and Electronic Recovery in Amorphous GaAs during Recrystallization

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Kennedy, Ellis Rae, Jones, Adric, Wang, Yongqiang, Pena, Miguel, Kim, Hyosim, Song, Chengyu, Selim, Farida, Uberuaga, Blas P., Greer, Samuel
Formato:	Preprint
Publicado:	2025
Materias:	Materials Science
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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