A Normalized Descriptor for Unbiased Screening of Second-Order Nonlinear Optical Materials

Fuente: arXiv
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Autori principali: Nyiri, Aubrey G. J., Waters, Michael J., Rondinelli, James M.
Natura: Preprint
Pubblicazione: 2025
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author Nyiri, Aubrey G. J.
Waters, Michael J.
Rondinelli, James M.
author_facet Nyiri, Aubrey G. J.
Waters, Michael J.
Rondinelli, James M.
contents Second-order nonlinear optical materials enable frequency doubling of light (second-harmonic generation, SHG), which is essential for optoelectronic applications ranging from materials characterization to quantum technologies. However, comparing SHG performance across materials remains challenging as the second-order nonlinear susceptibility $χ^{(2)}$ spans several orders of magnitude and strongly depends on the band gap $E_g$. To address this, we empirically validate a theoretical upper bound on $χ^{(2)}$ using new databases of \textit{ab initio}-computed nonlinear optical (NLO) properties. We then formulate a normalized descriptor, $\hat{d}$, which expresses the NLO response of a material relative to the band gap-dependent physical limit. We show that $\hat{d}$ exhibits a similar distribution across a wide range of band gap energies. This universality supports the use of $\hat{d}$ as a robust, generalizable descriptor for data-driven and chemistry-informed machine learning models of NLO response, enabling accelerated materials discovery and optimization across broad application frequencies.
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id arxiv_https___arxiv_org_abs_2511_03038
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle A Normalized Descriptor for Unbiased Screening of Second-Order Nonlinear Optical Materials
Nyiri, Aubrey G. J.
Waters, Michael J.
Rondinelli, James M.
Materials Science
Optics
Second-order nonlinear optical materials enable frequency doubling of light (second-harmonic generation, SHG), which is essential for optoelectronic applications ranging from materials characterization to quantum technologies. However, comparing SHG performance across materials remains challenging as the second-order nonlinear susceptibility $χ^{(2)}$ spans several orders of magnitude and strongly depends on the band gap $E_g$. To address this, we empirically validate a theoretical upper bound on $χ^{(2)}$ using new databases of \textit{ab initio}-computed nonlinear optical (NLO) properties. We then formulate a normalized descriptor, $\hat{d}$, which expresses the NLO response of a material relative to the band gap-dependent physical limit. We show that $\hat{d}$ exhibits a similar distribution across a wide range of band gap energies. This universality supports the use of $\hat{d}$ as a robust, generalizable descriptor for data-driven and chemistry-informed machine learning models of NLO response, enabling accelerated materials discovery and optimization across broad application frequencies.
title A Normalized Descriptor for Unbiased Screening of Second-Order Nonlinear Optical Materials
topic Materials Science
Optics
url https://arxiv.org/abs/2511.03038