Super-resolution Optical Near-field EM for bio- and materials science
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arXiv
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| Autores principales: | , , , , , , , , |
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| Formato: | Preprint |
| Publicado: |
2025
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| _version_ | 1866909887965954048 |
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| author | Zykov, Ilia Stam, Guido Jafarian, Hanieh Moradi, Amin Neu, Peter Tromp, Rudolf Amaro, Mariana Juffmann, Thomas van der Molen, Sense |
| author_facet | Zykov, Ilia Stam, Guido Jafarian, Hanieh Moradi, Amin Neu, Peter Tromp, Rudolf Amaro, Mariana Juffmann, Thomas van der Molen, Sense |
| contents | Microscopy has been key to tremendous advances in science, technology, and medicine, revealing structure and dynamics across time and length scales. However, combining high spatial and temporal resolution in a non-invasive, label-free imaging technique remains a central challenge in microscopy. Here, we introduce Optical Near-field Electron Microscopy (ONEM), a method that converts optical near-field intensity patterns into photoelectron emission, enabling nanometer-scale imaging using low-energy electron microscopy. ONEM achieves 31 nm spatial and sub-second temporal resolution without exposing the sample to electrons, preserving structural and functional integrity. We demonstrate ONEM across three distinct domains: imaging polarization-dependent plasmon modes in metal nanostructures; visualizing live Escherichia coli in liquid with orientation-resolved contrast in 3D; and capturing real-time electrodeposition of copper nanoclusters from solution. These results establish ONEM as a versatile platform for damage-free super-resolution imaging of interface dynamics in both vacuum and liquid, with broad implications for biology, electrochemistry, and nanophotonics. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2511_03597 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Super-resolution Optical Near-field EM for bio- and materials science Zykov, Ilia Stam, Guido Jafarian, Hanieh Moradi, Amin Neu, Peter Tromp, Rudolf Amaro, Mariana Juffmann, Thomas van der Molen, Sense Optics Microscopy has been key to tremendous advances in science, technology, and medicine, revealing structure and dynamics across time and length scales. However, combining high spatial and temporal resolution in a non-invasive, label-free imaging technique remains a central challenge in microscopy. Here, we introduce Optical Near-field Electron Microscopy (ONEM), a method that converts optical near-field intensity patterns into photoelectron emission, enabling nanometer-scale imaging using low-energy electron microscopy. ONEM achieves 31 nm spatial and sub-second temporal resolution without exposing the sample to electrons, preserving structural and functional integrity. We demonstrate ONEM across three distinct domains: imaging polarization-dependent plasmon modes in metal nanostructures; visualizing live Escherichia coli in liquid with orientation-resolved contrast in 3D; and capturing real-time electrodeposition of copper nanoclusters from solution. These results establish ONEM as a versatile platform for damage-free super-resolution imaging of interface dynamics in both vacuum and liquid, with broad implications for biology, electrochemistry, and nanophotonics. |
| title | Super-resolution Optical Near-field EM for bio- and materials science |
| topic | Optics |
| url | https://arxiv.org/abs/2511.03597 |