KAN-Enhanced Contrastive Learning Accelerating Crystal Structure Identification from XRD Patterns

Fuente: arXiv
Guardado en:
Detalles Bibliográficos
Autores principales: Xu, Chenlei, Su, Tianhao, Xiong, Jie, Wu, Yue, Dong, Shuya, Jiang, Tian, He, Mengwei, Chen, Shuai, Zhang, Tong-Yi
Formato: Preprint
Publicado: 2025
Materias:
Acceso en línea:
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
_version_ 1866910058599677952
author Xu, Chenlei
Su, Tianhao
Xiong, Jie
Wu, Yue
Dong, Shuya
Jiang, Tian
He, Mengwei
Chen, Shuai
Zhang, Tong-Yi
author_facet Xu, Chenlei
Su, Tianhao
Xiong, Jie
Wu, Yue
Dong, Shuya
Jiang, Tian
He, Mengwei
Chen, Shuai
Zhang, Tong-Yi
contents Accurate determination of crystal structures is central to materials science, underpinning the understanding of composition-structure-property relationships and the discovery of new materials. Powder X-ray diffraction is a key technique in this pursuit due to its versatility and reliability. However, current analysis pipelines still rely heavily on expert knowledge and slow iterative fitting, limiting their scalability in high-throughput and autonomous settings. Here, we introduce a physics-guided contrastive learning framework termed as XCCP. It aligns powder diffraction patterns with candidate crystal structures in a shared embedding space to enable efficient structure retrieval and symmetry recognition. The XRD encoder employs a dual-expert design with a Kolmogorov-Arnold Network projection head, one branch emphasizes low angle reflections reflecting long-range order, while the other captures dense high angle peaks shaped by symmetry. Coupled with a crystal graph encoder, contrastive pretraining yields physically grounded representations. XCCP demonstrates strong performance across tasks, with structure retrieval reaching 0.89 and space group identification attains 0.93 accuracy. The framework further generalizes to compositionally similar multi principal element alloys and demonstrates zero-shot transfer to experimental patterns. These results establish XCCP as a robust, interpretable, and scalable approach that offers a new paradigm for X-ray diffraction analysis. XCCP facilitates high-throughput screening, rapid structural validation and integration into autonomous laboratories.
format Preprint
id arxiv_https___arxiv_org_abs_2511_04055
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle KAN-Enhanced Contrastive Learning Accelerating Crystal Structure Identification from XRD Patterns
Xu, Chenlei
Su, Tianhao
Xiong, Jie
Wu, Yue
Dong, Shuya
Jiang, Tian
He, Mengwei
Chen, Shuai
Zhang, Tong-Yi
Materials Science
Disordered Systems and Neural Networks
Accurate determination of crystal structures is central to materials science, underpinning the understanding of composition-structure-property relationships and the discovery of new materials. Powder X-ray diffraction is a key technique in this pursuit due to its versatility and reliability. However, current analysis pipelines still rely heavily on expert knowledge and slow iterative fitting, limiting their scalability in high-throughput and autonomous settings. Here, we introduce a physics-guided contrastive learning framework termed as XCCP. It aligns powder diffraction patterns with candidate crystal structures in a shared embedding space to enable efficient structure retrieval and symmetry recognition. The XRD encoder employs a dual-expert design with a Kolmogorov-Arnold Network projection head, one branch emphasizes low angle reflections reflecting long-range order, while the other captures dense high angle peaks shaped by symmetry. Coupled with a crystal graph encoder, contrastive pretraining yields physically grounded representations. XCCP demonstrates strong performance across tasks, with structure retrieval reaching 0.89 and space group identification attains 0.93 accuracy. The framework further generalizes to compositionally similar multi principal element alloys and demonstrates zero-shot transfer to experimental patterns. These results establish XCCP as a robust, interpretable, and scalable approach that offers a new paradigm for X-ray diffraction analysis. XCCP facilitates high-throughput screening, rapid structural validation and integration into autonomous laboratories.
title KAN-Enhanced Contrastive Learning Accelerating Crystal Structure Identification from XRD Patterns
topic Materials Science
Disordered Systems and Neural Networks
url https://arxiv.org/abs/2511.04055