Laboratory-based x-ray microtomography with directional dark-field sensitivity
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arXiv
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| Main Authors: | , , , , , , , , , , , |
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| Format: | Preprint |
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2025
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| _version_ | 1866908633931972608 |
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| author | Navarrete-Leon, Carlos Gonzalez-Grajales, Alvaro Jose Allan, Harry Doherty, Adam Parmenter, Alissa D'Antuono, Rocco Bate, David Astolfo, Alberto Cipiccia, Silvia Hagen, Charlotte K. Olivo, Alessandro Endrizzi, Marco |
| author_facet | Navarrete-Leon, Carlos Gonzalez-Grajales, Alvaro Jose Allan, Harry Doherty, Adam Parmenter, Alissa D'Antuono, Rocco Bate, David Astolfo, Alberto Cipiccia, Silvia Hagen, Charlotte K. Olivo, Alessandro Endrizzi, Marco |
| contents | We demonstrate dark-field x-ray microtomography in a compact, laboratory-based system capable of resolving attenuation, phase, and anisotropic scattering signals with micrometer-scale resolution across centimetre-scale samples. The method is based on two-directional beam tracking (2DBT), which requires only a single optical element and is compatible with standard x-ray sources and detectors. We validate the system's capabilities through imaging of a custom-built phantom, a fibre-reinforced composite and ex-vivo biological tissues, including a bovine intervertebral disc, a rat heart, and a porcine meniscus. The results show that dark-field tomography provides complementary information to attenuation as well as to phase tomography, by revealing sub-resolution features such as fibre orientation and microstructural heterogeneity at length scales that are well below the voxel size. A key element of our system is its sensitivity to scattering along two orthogonal directions in the image plane, enabling the measurement of scattering anisotropy with a single exposure. As well as simple and robust, our approach is sensitive and precise. These findings demonstrate the potential of 2DBT for non-destructive and three-dimensional structural characterisation of samples and materials in engineering, materials science and biomedical applications. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2511_04420 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Laboratory-based x-ray microtomography with directional dark-field sensitivity Navarrete-Leon, Carlos Gonzalez-Grajales, Alvaro Jose Allan, Harry Doherty, Adam Parmenter, Alissa D'Antuono, Rocco Bate, David Astolfo, Alberto Cipiccia, Silvia Hagen, Charlotte K. Olivo, Alessandro Endrizzi, Marco Optics We demonstrate dark-field x-ray microtomography in a compact, laboratory-based system capable of resolving attenuation, phase, and anisotropic scattering signals with micrometer-scale resolution across centimetre-scale samples. The method is based on two-directional beam tracking (2DBT), which requires only a single optical element and is compatible with standard x-ray sources and detectors. We validate the system's capabilities through imaging of a custom-built phantom, a fibre-reinforced composite and ex-vivo biological tissues, including a bovine intervertebral disc, a rat heart, and a porcine meniscus. The results show that dark-field tomography provides complementary information to attenuation as well as to phase tomography, by revealing sub-resolution features such as fibre orientation and microstructural heterogeneity at length scales that are well below the voxel size. A key element of our system is its sensitivity to scattering along two orthogonal directions in the image plane, enabling the measurement of scattering anisotropy with a single exposure. As well as simple and robust, our approach is sensitive and precise. These findings demonstrate the potential of 2DBT for non-destructive and three-dimensional structural characterisation of samples and materials in engineering, materials science and biomedical applications. |
| title | Laboratory-based x-ray microtomography with directional dark-field sensitivity |
| topic | Optics |
| url | https://arxiv.org/abs/2511.04420 |