MDM: Manhattan Distance Mapping of DNN Weights for Parasitic-Resistance-Resilient Memristive Crossbars

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Hauptverfasser: Farias, Matheus, Martins, Wanghley, Kung, H. T.
Format: Preprint
Veröffentlicht: 2025
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author Farias, Matheus
Martins, Wanghley
Kung, H. T.
author_facet Farias, Matheus
Martins, Wanghley
Kung, H. T.
contents Manhattan Distance Mapping (MDM) is a post-training deep neural network (DNN) weight mapping technique for memristive bit-sliced compute-in-memory (CIM) crossbars that reduces parasitic resistance (PR) nonidealities. PR limits crossbar efficiency by mapping DNN matrices into small crossbar tiles, reducing CIM-based speedup. Each crossbar executes one tile, requiring digital synchronization before the next layer. At this granularity, designers either deploy many small crossbars in parallel or reuse a few sequentially-both increasing analog-to-digital conversions, latency, I/O pressure, and chip area. MDM alleviates PR effects by optimizing active-memristor placement. Exploiting bit-level structured sparsity, it feeds activations from the denser low-order side and reorders rows according to the Manhattan distance, relocating active cells toward regions less affected by PR and thus lowering the nonideality factor (NF). Applied to DNN models on ImageNet-1k, MDM reduces NF by up to 46% and improves accuracy under analog distortion by an average of 3.6% in ResNets. Overall, it provides a lightweight, spatially informed method for scaling CIM DNN accelerators.
format Preprint
id arxiv_https___arxiv_org_abs_2511_04798
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle MDM: Manhattan Distance Mapping of DNN Weights for Parasitic-Resistance-Resilient Memristive Crossbars
Farias, Matheus
Martins, Wanghley
Kung, H. T.
Hardware Architecture
Artificial Intelligence
Emerging Technologies
Machine Learning
Manhattan Distance Mapping (MDM) is a post-training deep neural network (DNN) weight mapping technique for memristive bit-sliced compute-in-memory (CIM) crossbars that reduces parasitic resistance (PR) nonidealities. PR limits crossbar efficiency by mapping DNN matrices into small crossbar tiles, reducing CIM-based speedup. Each crossbar executes one tile, requiring digital synchronization before the next layer. At this granularity, designers either deploy many small crossbars in parallel or reuse a few sequentially-both increasing analog-to-digital conversions, latency, I/O pressure, and chip area. MDM alleviates PR effects by optimizing active-memristor placement. Exploiting bit-level structured sparsity, it feeds activations from the denser low-order side and reorders rows according to the Manhattan distance, relocating active cells toward regions less affected by PR and thus lowering the nonideality factor (NF). Applied to DNN models on ImageNet-1k, MDM reduces NF by up to 46% and improves accuracy under analog distortion by an average of 3.6% in ResNets. Overall, it provides a lightweight, spatially informed method for scaling CIM DNN accelerators.
title MDM: Manhattan Distance Mapping of DNN Weights for Parasitic-Resistance-Resilient Memristive Crossbars
topic Hardware Architecture
Artificial Intelligence
Emerging Technologies
Machine Learning
url https://arxiv.org/abs/2511.04798