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An improved reliability factor for quantitative low-energy electron diffraction

Fuente: arXiv

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Bibliographic Details
Main Authors:	Imre, Alexander M., Hammer, Lutz, Diebold, Ulrike, Riva, Michele, Schmid, Michael
Format:	Preprint
Published:	2025
Subjects:	Materials Science Instrumentation and Detectors
Online Access:	Acceder al recurso
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