Delay Time Characterization on FPGA: A Low Nonlinearity, Picosecond Resolution Time-to-Digital Converter on 16-nm FPGA using Bin Sequence Calibration
Fuente:
arXiv
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| Main Authors: | , , , , , |
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| Format: | Preprint |
| Published: |
2025
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| Subjects: | |
| Online Access: | |
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