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Delay Time Characterization on FPGA: A Low Nonlinearity, Picosecond Resolution Time-to-Digital Converter on 16-nm FPGA using Bin Sequence Calibration

Fuente: arXiv

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Bibliographic Details
Main Authors:	Park, Sunwoo, Park, Byungkwon, Kim, Eunsung, Yune, Jiwon, Han, Seungho, Nam, Seunggo
Format:	Preprint
Published:	2025
Subjects:	Hardware Architecture Instrumentation and Detectors Quantum Physics
Online Access:	Acceder al recurso
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