Point Cloud Segmentation of Integrated Circuits Package Substrates Surface Defects Using Causal Inference: Dataset Construction and Methodology

Fuente: arXiv

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Bibliographic Details
Main Authors:	Guo, Bingyang, Zuo, Qiang, Yu, Ruiyun
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2511.05853