Compressive multi-beam scanning transmission electron microscopy
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arXiv
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| Hauptverfasser: | , , |
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| Format: | Preprint |
| Veröffentlicht: |
2025
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| _version_ | 1866910056849604608 |
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| author | Yasuhara, Akira Sannomiya, Takumi Horisaki, Ryoichi |
| author_facet | Yasuhara, Akira Sannomiya, Takumi Horisaki, Ryoichi |
| contents | We demonstrate a multi-beam scanning transmission electron microscopy (STEM) imaging that integrates down-sampling with super-resolution image reconstruction via a compressive sensing framework. A custom condenser aperture with six randomly positioned circular holes is employed to produce a multi-beam STEM probe, with the beam shape and distribution tuned through defocus. While the raw multi-beam images exhibit overlapping patterns, reconstruction using Adam optimization and total variation normalization yields high-fidelity images that closely reproduce the original sample structures, even from substantially down-sampled data. The proposed approach offers a pathway toward significant acceleration of such techniques through multibeam sparse sampling and computational reconstruction potentially useful for the analytical scanning methods in general. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2511_05864 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Compressive multi-beam scanning transmission electron microscopy Yasuhara, Akira Sannomiya, Takumi Horisaki, Ryoichi Instrumentation and Detectors Optics We demonstrate a multi-beam scanning transmission electron microscopy (STEM) imaging that integrates down-sampling with super-resolution image reconstruction via a compressive sensing framework. A custom condenser aperture with six randomly positioned circular holes is employed to produce a multi-beam STEM probe, with the beam shape and distribution tuned through defocus. While the raw multi-beam images exhibit overlapping patterns, reconstruction using Adam optimization and total variation normalization yields high-fidelity images that closely reproduce the original sample structures, even from substantially down-sampled data. The proposed approach offers a pathway toward significant acceleration of such techniques through multibeam sparse sampling and computational reconstruction potentially useful for the analytical scanning methods in general. |
| title | Compressive multi-beam scanning transmission electron microscopy |
| topic | Instrumentation and Detectors Optics |
| url | https://arxiv.org/abs/2511.05864 |