APA (7th ed.) Citation

Wu, C., & Li, X. (2025). SinSEMI: A One-Shot Image Generation Model and Data-Efficient Evaluation Framework for Semiconductor Inspection Equipment.

Chicago Style (17th ed.) Citation

Wu, ChunLiang, and Xiaochun Li. SinSEMI: A One-Shot Image Generation Model and Data-Efficient Evaluation Framework for Semiconductor Inspection Equipment. 2025.

MLA (9th ed.) Citation

Wu, ChunLiang, and Xiaochun Li. SinSEMI: A One-Shot Image Generation Model and Data-Efficient Evaluation Framework for Semiconductor Inspection Equipment. 2025.

Warning: These citations may not always be 100% accurate.