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Bibliographic Details
Main Authors: Telenkov, M. P., Mityagin, Yu. A.
Format: Preprint
Published: 2025
Subjects:
Online Access:https://arxiv.org/abs/2511.06771
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author Telenkov, M. P.
Mityagin, Yu. A.
author_facet Telenkov, M. P.
Mityagin, Yu. A.
contents Scattering processes by the interface roughness in a quantum well in a quantizing magnetic field are considered. An expression for the scattering rate is derived for a magnetic field tilted relative to the quantum well layers. By analyzing this expression, trends in the behavior of the scattering rate are established with variation in the magnetic field strength and orientation, the potential profile of the quantum well, and the interface roughness parameters.
format Preprint
id arxiv_https___arxiv_org_abs_2511_06771
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Interface Roughness Scattering Processes in Quantum wells in a Tilted Quantizing Magnetic Field
Telenkov, M. P.
Mityagin, Yu. A.
Mesoscale and Nanoscale Physics
Scattering processes by the interface roughness in a quantum well in a quantizing magnetic field are considered. An expression for the scattering rate is derived for a magnetic field tilted relative to the quantum well layers. By analyzing this expression, trends in the behavior of the scattering rate are established with variation in the magnetic field strength and orientation, the potential profile of the quantum well, and the interface roughness parameters.
title Interface Roughness Scattering Processes in Quantum wells in a Tilted Quantizing Magnetic Field
topic Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2511.06771