TEM Agent: enhancing transmission electron microscopy (TEM) with modern AI tools

Fuente: arXiv

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Bibliographic Details
Main Authors:	Wall, Morgan K., Pattison, Alexander J., Barnard, Edward S., Ribet, Stephanie M., Ercius, Peter
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2511.08819