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Bayesian inference for precise and uncertainty-quantified single-shot widefield interferometric geometrical nanometrology

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Suski, Damian, Cywinska, Maria, Winnik, Julianna, Jozwik, Michal, Zdankowski, Piotr, Ahmad, Azeem, Ahluwalia, Balpreet S., Trusiak, Maciej
Format:	Preprint
Publié:	2025
Sujets:	Optics Applications
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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