How Small Can You Go? Compact Language Models for On-Device Critical Error Detection in Machine Translation

Fuente: arXiv

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Bibliographic Details
Main Authors:	Chopra, Muskaan, Sparrenberg, Lorenz, Khanna, Sarthak, Sifa, Rafet
Format:	Preprint
Published:	2025
Subjects:	Computation and Language Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2511.09748