CertMask: Certifiable Defense Against Adversarial Patches via Theoretically Optimal Mask Coverage

Fuente: arXiv

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Bibliographic Details
Main Authors:	Lyu, Xuntao, Lin, Ching-Chi, Arafat, Abdullah Al, von der Brüggen, Georg, Chen, Jian-Jia, Guo, Zhishan
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2511.09834